Calculators for thin film coatings, AR coatings, and dielectric stacks.
45 calculators
Quarter-wave antireflection coating design with Snell's law and explicit s/p polarization handling at oblique incidence.
Thin-film adhesion tests: Benjamin–Weaver shear stress from a scratch critical load, Kendall peel energy, ASTM D3359 tape classes, and bend-test film stress with crack and delamination driving forces.
Multiple-beam interference from amplitude splitting at a thin film. Shows how partial reflections from each interface combine to form interference fringes.
Changing the angle of incidence shifts the spectral response of thin-film coatings toward shorter wavelengths: s and p spectra of a quarter-wave stack versus angle.
How the effective design wavelength shifts with angle of incidence (blue shift).
Hydrophilic anti-fog coating: transmittance dry and under a water film, the share of a droplet's footprint lost to total internal reflection, and the wetting tension from the contact angle.
Fabry-Perot bandpass — multi-cavity design with quarter-wave mirrors and half-wave spacers.
Design a dielectric beamsplitter for a target reflectance: the single-layer index it needs, quarter-wave stack reflectances, a thinned-layer design and an all-quarter-wave H M H design.
Dielectric distributed Bragg reflector: reflectance spectrum, stop band and period, and the band structure of the 1D photonic crystal with its gap/midgap ratio and Bloch decay per period.
Substrate curvature and radius from thin-film stress with the Stoney equation.
Cold mirror design: long-pass quarter-wave stacks in series reflect the visible and transmit the infrared. Mean R, IR transmittance and the edge.
Dichroic beam splitter at oblique incidence. Shows s- and p-polarisation splitting characteristic of dichroic filters used at 45°.
Quarter-wave dielectric stack HR mirror — stopband width, peak reflectance, and dispersion.
Quarter-wave dielectric stack reflectance. Alternating high/low index layers create high-reflectance mirrors — the basis of dielectric mirrors and VCSELs.
Three-layer anti-reflection coating fitted for two wavelengths: thicknesses, residual reflectance and the band below 1 % around each.
Long-pass and short-pass quarter-wave edge filters, (H/2 L H/2)^N and (L/2 H L/2)^N: design wavelength for an edge, 50 % point and R/T spectrum.
Invert ellipsometry data (Psi, Delta) to the pseudo-dielectric function and pseudo-refractive index of a substrate, or to the thickness of a transparent film of known index.
Thermal emittance of a coated opaque surface from Kirchhoff's law: low-e metal films and overcoats, Planck-weighted over a band at any temperature.
Aluminium mirror with quarter-wave enhancing pairs: reflectance at the design wavelength and over 400–700 nm, against bare Al.
How water in porous layers and temperature shift a quarter-wave stack's spectrum, how much area particles of an IEST-STD-CC1246 cleanliness level obscure, and the Arrhenius–Peck acceleration factor of an ageing test.
Fabry-Pérot etalon/filter transmission based on the Airy function. Explore how mirror reflectance and cavity spacing control spectral selectivity.
Graded-index coating from the substrate index to a low surface index: broadband AR from a smooth profile (linear, cosine or exponential).
Single hard coating on a lens or window: reflectance and the absentee (half-wave) thickness, substrate bow from film stress (Stoney), and the thickness below which the film cannot delaminate.
Transparent heat mirror (low-e glass): a thin silver film between two high-index layers. Light and solar transmittance of the pane and the thermal emittance of the coated face.
Ion-assisted deposition: ion and molecule arrival rates, ions per deposited molecule, and ion energy and momentum per molecule from the ion current density, ion energy and deposition rate.
IR-blocking filter (hot mirror): short-pass quarter-wave stacks in series reflect the near IR and transmit the visible.
Metal-dielectric coating design. Explore how a dielectric overcoat modifies the reflectance, transmittance, and absorptance of a thin metal layer.
Multiple-cavity Fabry-Perot filter with long quarter-wave mirrors: a narrow, flat-topped pass band, its FWHM, peak transmittance and ripple.
Rejection notch filter — high reflectance at target wavelength, transmits elsewhere.
Reflectance of a single dielectric layer for partial reflectors (output couplers, etalon mirrors), from the bare substrate up to the quarter-wave maximum.
Phase shift accumulated in thin film coatings. Explore how film thickness and refractive index affect the optical phase of reflected and transmitted light.
Argon discharge for plasma-assisted deposition: electron temperature from particle balance, plasma density from power balance, ion flux and ion energy at the substrate, Debye length.
Protected silver coating — high reflectance from the visible to the IR with dielectric overcoat and adhesion layer.
Quarter-wave optical thickness (QWOT): nd = λ/4, and the single-layer reflectance at the design wavelength. Zero reflectance when nfilm = √(ninc·nsub).
All-dielectric solar-control coating on glass: UV and near-IR reflectors, with transmittances weighted by the ASTM G173 AM1.5 solar spectrum.
Model spectrophotometric R, T, A spectra for a single absorbing thin film using transfer matrix method with complex refractive index.
DC magnetron sputtering of a metal target in argon: ion current, sputtered atom rate from measured yields, on-axis deposition rate, sputtered-atom energy, gas thermalisation distance and structure zone.
Thermal evaporation of metals: vapour pressure from the Alcock et al. fits, Hertz–Knudsen flux, growth rate and thickness profile from a small cosine source, mean free path and structure zone.
Constructive and destructive interference patterns from a single thin film, accounting for phase shifts at boundaries.
Calculate film stress from substrate curvature using the Stoney equation. Includes thermal stress decomposition and stored elastic energy.
Transfer-matrix method for two-layer quarter-quarter (V-coat) AR designs. Both layers at quarter-wave optical thickness.
UV-blocking filter: long-pass quarter-wave stacks in series reflect the UV and transmit the visible.
Wavelength separation coatings combine quarter-wave stacks at different design wavelengths to reflect some bands and transmit others.
Wedged thin films have a linearly varying thickness across the surface, creating fringes of equal thickness with spacing λ/(2n·tan α).
Wide band-pass filter from a long-pass edge filter on one face and a short-pass on the other: 50 % points, width and peak transmittance.